Raman and scanning electron microscopy measurements of RDX on glass substrates

Perla Torres; Liza Mercado; Lewis Mortimer; Nairmen Mina; Samuel P. Hernandez-Rivera; Richard T. Lareau; R. Thomas Chamberlain; Miguel E. Castro

doi:10.1117/12.487178

11 September 2003 Raman and scanning electron microscopy measurements of RDX on glass substrates

Perla Torres, Liza Mercado, Lewis Mortimer, Nairmen Mina, Samuel P. Hernandez-Rivera, Richard T. Lareau, R. Thomas Chamberlain, Miguel E. Castro

Author Affiliations +

Proceedings Volume 5089, Detection and Remediation Technologies for Mines and Minelike Targets VIII; (2003) https://doi.org/10.1117/12.487178
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

Trace explosive detection is a major technological challenge. Spectroscopic characterization of explosive traces is a major step toward explosive detection strategies and sensor development. We report here on white light imaging measurements and Raman microscopy, atomic force microscopy (AFM), scanning electron microscopy (SEM) and energy dispersed X ray analysis (EDX) for the characterization RDX nanoparticles deposited on glass substrates surfaces. The RDX nanoparticles were prepared by exposure of glass substrate surfaces to an aerosol jet containing RDX. An average RDX particle size of 300 nm is determined from the SEM measurements. The spectroscopic signature of the RDX nanoparticles between 750 and 950 cm^-1is dominated by the ring breathing mode centered at about 877 cm^-1. The smallest particle characterized with vibrational spectroscopy measurements are about 750 nm in size.

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Perla Torres, Liza Mercado, Lewis Mortimer, Nairmen Mina, Samuel P. Hernandez-Rivera, Richard T. Lareau, R. Thomas Chamberlain, and Miguel E. Castro "Raman and scanning electron microscopy measurements of RDX on glass substrates", Proc. SPIE 5089, Detection and Remediation Technologies for Mines and Minelike Targets VIII, (11 September 2003); https://doi.org/10.1117/12.487178

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