Real-time IR/EO scene simulator (RISS) product improvements

Douglas C. McKee; Onda D. Simmons; Robert J. Makar; Mark E. Nuwer; Paul W. Palumbo; Paul G. Schlossman; Roderic C. Perry; Louis Chan

doi:10.1117/12.501200

12 September 2003 Real-time IR/EO scene simulator (RISS) product improvements

Douglas C. McKee, Onda D. Simmons, Robert J. Makar, Mark E. Nuwer, Paul W. Palumbo, Paul G. Schlossman, Roderic C. Perry, Louis Chan

Author Affiliations +

Proceedings Volume 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII; (2003) https://doi.org/10.1117/12.501200
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

Northrop Grumman Amherst Systems has continued to improve the Real-time IR/EO Scene Simulator (RISS) for hardware-in-the-loop (HWIL) testing of infrared sensor systems. Several new and enhanced capabilities have been added to the system for both customer and internal development programs. A new external control capability provides control of either player trajectories or unit-under-test (UUT) orientation. The RISS Scene Rendering Subsystem (SRS) has been enhanced with support for texture transparency and increased texture memory capacity. The RISS Universal Programmable Interface (UPI) graphical user interface (GUI) has been improved to provide added flexibility and control of the real-time sensor modeling capabilities. This paper will further explore these and other product improvements.

Citation Download Citation

Douglas C. McKee, Onda D. Simmons, Robert J. Makar, Mark E. Nuwer, Paul W. Palumbo, Paul G. Schlossman, Roderic C. Perry, and Louis Chan "Real-time IR/EO scene simulator (RISS) product improvements", Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); https://doi.org/10.1117/12.501200

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