Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere

Jacob C. Jonsson; Arne Roos; Geoffrey B. Smith

doi:10.1117/12.508196

14 November 2003 Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere

Jacob C. Jonsson, Arne Roos, Geoffrey B. Smith

Author Affiliations +

Proceedings Volume 5192, Optical Diagnostic Methods for Inorganic Materials III; (2003) https://doi.org/10.1117/12.508196
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

When a beam of light is incident on a translucent sample, a significant fraction of the light is scattered at high angles. Some of this scattered light may be trapped inside the substrate through multiple reflections and total internal reflection, similar to light coupling into an optical fiber. The trapping depends on factors such as the surface roughness of the external surfaces and/or the size and distribution of scattering particles inside the sample. The scattered light may thus escape out of the sample at a shifted position relative to the incident beam. This leads to port losses in an integrating sphere. The detected signal from the light entering the sphere then underestimates the hemispherical transmittance. In this paper the signal versus lateral position has been measured in an attempt to estimate the error and to find an extrapolation procedure for the correct transmittance value. The lateral measurements were carried out by moving a detector behind the sample, a procedure carried out at several angles of incidence. Different illumination methods have also been studied both theoretically and experimentally to further investigate what effect light trapping can have when characterising scattering samples.

Citation Download Citation

Jacob C. Jonsson, Arne Roos, and Geoffrey B. Smith "Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere", Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); https://doi.org/10.1117/12.508196

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