Paper
13 January 2004 Fabrication and metrology of 10X Schwarschild optics for EUV imaging
Louis A. Marchetti
Author Affiliations +
Abstract
ASML Optics recently completed two sets of 10X Schwarschild optics for use in an EUV imaging application. The 10X system consists of two spherical elements - a primary, convex element fabricated from fused silica and a secondary, concave element fabricated from Zerodur. This paper outlines the fabrication process, and discusses the challenges to optical metrology due to the particular form factor and the exacting tolerances placed on the optics. These challenges were met using a variety of metrology tools including full-aperture metrology, phase measuring microscopy (PMM), atomic force microscopy (AFM), and a new mid-frequency interferometer (SASHIMI). A comparison of the recently completed optics is made to the set of 10X optics previously fabricated and delivered in early 1999.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Louis A. Marchetti "Fabrication and metrology of 10X Schwarschild optics for EUV imaging", Proc. SPIE 5193, Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications, (13 January 2004); https://doi.org/10.1117/12.510318
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Cited by 3 scholarly publications.
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KEYWORDS
Mirrors

Metrology

EUV optics

Atomic force microscopy

Extreme ultraviolet

Polishing

Cameras

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