Paper
18 February 2004 Comparison of flux-tracing-based and diffraction-based strategies for optical system evaluation
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Abstract
We report the comparison between two methods to evaluate optical systems. The flux-tracing method is an extension of the classical ray-tracing methods with additional energetic features. The direct integration method involves the calculation of the integral appearing in the diffraction theory of aberrations. We give a brief outline of the two methods and compare the results on a standard optical system. This will help to put in common the two methods to try to formulate new algorithms for the design of optical systems.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Josep Arasa, Salvador Bosch, Josep Ferre-Borrull, and Carles Pizarro "Comparison of flux-tracing-based and diffraction-based strategies for optical system evaluation", Proc. SPIE 5249, Optical Design and Engineering, (18 February 2004); https://doi.org/10.1117/12.513367
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Cited by 1 scholarly publication.
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KEYWORDS
Optical design

Diffraction

Zemax

Geometrical optics

Point spread functions

Ray tracing

Binary data

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