Paper
1 July 2004 Functional optical coherence tomography of stimulated and spontaneous scattering changes in neural tissue
Mariya Lazebnik, Daniel L. Marks, Kurt Potgieter, Rhanor Gillette, Stephen A. Boppart
Author Affiliations +
Abstract
We demonstrate the use of functional optical coherence tomography (fOCT) for observing action potential propagation by detecting scattering changes in neural tissue. FOCT images of nerve fibers from the abdominal ganglion of the sea slug Aplysia californica were obtained before, during, and after electrical stimulation with monophasic as well as biphasic voltage pulses. A reversible localized increase in optical scattering was noted in the images obtained during stimulation compared to the images obtained before stimulation. In addition, M (motion)-mode images showed transient optical changes due to spontaneous electrical activity. To exclude local laser-induced temperature changes as a source for stimulation, we monitored the temperature effects of prolonged laser exposure with a thermistor and found that there was no substantial temperature increase. We conclude that OCT is sensitive to the optical changes induced in electrically stimulated nerve fibers, and that there is minimal tissue heating and no detectable damage caused by exposure to the laser.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mariya Lazebnik, Daniel L. Marks, Kurt Potgieter, Rhanor Gillette, and Stephen A. Boppart "Functional optical coherence tomography of stimulated and spontaneous scattering changes in neural tissue", Proc. SPIE 5316, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine VIII, (1 July 2004); https://doi.org/10.1117/12.530978
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical coherence tomography

Tissue optics

Scattering

Optical fibers

Nerve

Light scattering

Temperature metrology

Back to Top