Multidimensional strain and temperature measurements using a novel high-birefringent fiber Bragg grating interrogation system

Edmon Chehura; Alexandros A. Skordos; Chen-Chun Ye; Stephen W. James; Ivana K. Partridge; Ralph P. Tatam

doi:10.1117/12.545746

10 September 2004 Multidimensional strain and temperature measurements using a novel high-birefringent fiber Bragg grating interrogation system

Edmon Chehura, Alexandros A. Skordos, Chen-Chun Ye, Stephen W. James, Ivana K. Partridge, Ralph P. Tatam

Author Affiliations +

Proceedings Volume 5457, Optical Metrology in Production Engineering; (2004) https://doi.org/10.1117/12.545746
Event: Photonics Europe, 2004, Strasbourg, France

Abstract

Temperature and transverse load sensitivities of fibre Bragg gratings (FBGs) fabricated in a range of commercially available high birefringent (HiBi) fibre were measured and compared for the 1550 nm wavelength region. The highest transverse load sensitivity, of 0.23 ± 0.02 nm/(N/mm), and temperature sensitivity, of 16.5 ± 0.1 pm/⁰C, were obtained with FBGs fabricated in elliptically clad and Panda fibres respectively. The greatest differential transverse load and temperature sensitivities were measured between the eigen axes of the bow tie and elliptical clad fibres respectively. The FBGs fabricated in bow tie fibre were successfully used to monitor the transverse strain development during the cure process of glass fibre/epoxy composites and of unreinforced resins. It was observed that the development of transverse strain was sensitive to the degree of cure of the resin. A FBG fabricated in single mode fibre was also used to monitor the predominantly axial strain development, during the cure of a glass fibre composite, for comparison with transverse strain measurements.

Citation Download Citation

Edmon Chehura, Alexandros A. Skordos, Chen-Chun Ye, Stephen W. James, Ivana K. Partridge, and Ralph P. Tatam "Multidimensional strain and temperature measurements using a novel high-birefringent fiber Bragg grating interrogation system", Proc. SPIE 5457, Optical Metrology in Production Engineering, (10 September 2004); https://doi.org/10.1117/12.545746

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