A rapid-turnaround cryogenic detector characterization system

Dominic J. Benford; Michael J. Dipirro; Joshua Forgione; Cliffton E. Jackson; Michael L. Jackson; Alan Kogut; S. Harvey Moseley Jr.; Peter J. Shirron; Richard A. Shafer

doi:10.1117/12.552119

8 October 2004 A rapid-turnaround cryogenic detector characterization system

Dominic J. Benford, Michael J. Dipirro, Joshua Forgione, Cliffton E. Jackson, Michael L. Jackson, Alan Kogut, S. Harvey Moseley Jr., Peter J. Shirron, Richard A. Shafer

Author Affiliations +

Proceedings Volume 5498, Millimeter and Submillimeter Detectors for Astronomy II; (2004) https://doi.org/10.1117/12.552119
Event: SPIE Astronomical Telescopes + Instrumentation, 2004, Glasgow, United Kingdom

Abstract

Upcoming major NASA missions such as the Einstein Inflation Probe and the Single Aperture Far-Infrared Observatory require arrays of detectors with thousands of elements, operating at temperatures near 100 mK and sensitive to wavelengths from ~50 μm to ~3 mm. Such detectors represent a substantial enabling technology for these missions, and must be demonstrated soon in order for them to proceed. In order to make rapid progress on detector development, the cryogenic testing cycle must be made convenient and quick. We have developed a cryogenic detector characterization system capable of testing superconducting detector arrays in formats up to 8x32, read out by SQUID multiplexers. The system relies on the cooling of a two-stage adiabatic demagnetization refrigerator immersed in a liquid helium bath. This approach permits a detector to be cooled from 300 K to 50 mK in about 4 hours, so that a test cycle begun in the morning will be over by the end of the day. The system is modular, with two identical immersible units, so that while one unit is cooling, the second can be reconfigured for the next battery of tests. We describe the design, construction, and predicted performance of this cryogenic detector testing facility.

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Dominic J. Benford, Michael J. Dipirro, Joshua Forgione, Cliffton E. Jackson, Michael L. Jackson, Alan Kogut, S. Harvey Moseley Jr., Peter J. Shirron, and Richard A. Shafer "A rapid-turnaround cryogenic detector characterization system", Proc. SPIE 5498, Millimeter and Submillimeter Detectors for Astronomy II, (8 October 2004); https://doi.org/10.1117/12.552119

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