Paper
29 September 2004 LISA pathfinder optical interferometry
Claus Braxmaier, Gerhard Heinzel, Kevin F. Middleton, Martin E. Caldwell, W. Konrad, H. Stockburger, S. Lucarelli, Maurice B. te Plate, V. Wand, A. C. Garcia, F. Draaisma, J. Pijnenburg, D. I. Robertson, Christian Killow, Harry Ward, Karsten Danzmann, Ulrich A. Johann
Author Affiliations +
Abstract
The LISA Technology Package (LTP) aboard of LISA pathfinder mission is dedicated to demonstrate and verify key technologies for LISA, in particular drag free control, ultra-precise laser interferometry and gravitational sensor. Two inertial sensor, the optical interferometry in between combined with the dimensional stable Glass ceramic Zerodur structure are setting up the LTP. The validation of drag free operation of the spacecraft is planned by measuring laser interferometrically the relative displacement and tilt between two test masses (and the optical bench) with a noise levels of 10pm/√Hz and 10 nrad/√Hz between 3mHz and 30mHz. This performance and additionally overall environmental tests was currently verified on EM level. The OB structure is able to support two inertial sensors (≈17kg each) and to withstand 25 g design loads as well as 0...40°C temperature range. Optical functionality was verified successfully after environmental tests. The engineering model development and manufacturing of the optical bench and interferometry hardware and their verification tests will be presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Claus Braxmaier, Gerhard Heinzel, Kevin F. Middleton, Martin E. Caldwell, W. Konrad, H. Stockburger, S. Lucarelli, Maurice B. te Plate, V. Wand, A. C. Garcia, F. Draaisma, J. Pijnenburg, D. I. Robertson, Christian Killow, Harry Ward, Karsten Danzmann, and Ulrich A. Johann "LISA pathfinder optical interferometry", Proc. SPIE 5500, Gravitational Wave and Particle Astrophysics Detectors, (29 September 2004); https://doi.org/10.1117/12.555266
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Cited by 10 scholarly publications.
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KEYWORDS
Interferometers

Nanoimprint lithography

Optical benches

Sensors

Zerodur

Interferometry

Metrology

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