Physical model for near-field scattering and manipulation

Djenan Ganic; Xiaosong Gan; Min Gu

doi:10.1117/12.555746

18 October 2004 Physical model for near-field scattering and manipulation

Djenan Ganic, Xiaosong Gan, Min Gu

Proceedings Volume 5514, Optical Trapping and Optical Micromanipulation; (2004) https://doi.org/10.1117/12.555746
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

We present a physical model for the conversion of the evanescent photons into propagating photons detectable by an imaging system. The conversion mechanism consists of two physical processes, near-field Mie scattering enhanced by morphology dependant resonance and vectorial diffraction. For dielectric probe particles, these two processes lead to the formation of an interference-like pattern in the far-field of a collecting objective. The detailed knowledge of the far-field structure of converted evanescent photons is extremely important for designing novel detection systems. The model is also applicable for determination of the near-field force exerted on small particles situated in an evanescent field. This model should find broad applications in near-field imaging, optical nanometry and near-field metrology.

Citation Download Citation

Djenan Ganic, Xiaosong Gan, and Min Gu "Physical model for near-field scattering and manipulation", Proc. SPIE 5514, Optical Trapping and Optical Micromanipulation, (18 October 2004); https://doi.org/10.1117/12.555746

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