Using a sheet of specklegram: the development of fringe analysis method for ESPI

Yasuhiko Arai; Shunsuke Yokozeki

doi:10.1117/12.560333

2 August 2004 Using a sheet of specklegram: the development of fringe analysis method for ESPI

Yasuhiko Arai, Shunsuke Yokozeki

Proceedings Volume 5531, Interferometry XII: Techniques and Analysis; (2004) https://doi.org/10.1117/12.560333
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

The ordinary fringe analysis method based on Fourier transform cannot analyze a closed fringes using only single specklegram produced with two sheets of speckle patterns before and after deformation. On the basis of this discussion, the novel fringe analysis method is proposed in this paper. In the proposed method, not a specklegram but speckle patterns that produce the specklgram are directly analyzed using Fourier transform technology. Then, the ordinary problems can be solved by the proposed method. In the experiment, it is confirmed that the new proposed method can analyze an out-of-plane displacement using only two sheets of speckle patterns before and after deformation.

Citation Download Citation

Yasuhiko Arai and Shunsuke Yokozeki "Using a sheet of specklegram: the development of fringe analysis method for ESPI", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); https://doi.org/10.1117/12.560333

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