Evaluation of a portable FTIR for in-situ field measurements of surface reflectance

Rob K. Newsom; Robert D. Kaiser; August O. Schutte

doi:10.1117/12.560501

2 August 2004 Evaluation of a portable FTIR for in-situ field measurements of surface reflectance

Rob K. Newsom, Robert D. Kaiser, August O. Schutte

Proceedings Volume 5532, Interferometry XII: Applications; (2004) https://doi.org/10.1117/12.560501
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Development of target detection algorithms and simulation models for present and future multispectral and hyperspectral sensor systems requires accurate characterization of the reflectance and thermal emission of natural and man-made materials. Fourier transform spectrometry is one method for obtaining relatively high spectral resolution, in-situ measurements of surface reflectance. This paper discusses the performance characteristics of the SOC-400T FTIR and its application to field measurements. The SOC-400T is a relatively small and portable FTIR reflectometer that was designed to measure the directional reflectance and calculate the directional thermal emittance of surfaces in the spectral range from 2 to 25 ημm. The SOC-400T uses a silicone carbide glowbar to illuminate samples. This permits accurate results to be obtained in the MWIR. We recently deployed this instrument to the field to perform measurements on various materials of interest to the military. Prior to the deployment, the instrument was evaluated to assess its performance under true field operating conditions. This paper specifically examines noise characteristics, warmup time, transients induced by reorientation of the sensor, spurious detector artifacts, and sensitivity to vibration. We also address the practical issue associated with positioning, stabilizing, and calibrating the instrument for field measurements of irregular or arbitrarily oriented surfaces.

Citation Download Citation

Rob K. Newsom, Robert D. Kaiser, and August O. Schutte "Evaluation of a portable FTIR for in-situ field measurements of surface reflectance", Proc. SPIE 5532, Interferometry XII: Applications, (2 August 2004); https://doi.org/10.1117/12.560501

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
12 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Reflectivity

Sensors

Calibration

System on a chip

Gold

Signal to noise ratio

Apodization

Show All Keywords

Keywords/Phrases

Search In:

Publication Years