Paper
4 November 2004 Nanofocusing parabolic refractive x-ray lenses
Christian G. Schroer, Marion Kuhlmann, Olga Kurapova, U. T. Hunger, Til Florian Gunzler, Sebastian Feste, Bruno Lengeler, Stefan Ziegler, Michael Drakopoulos, Manfred Burghammer, Christian Riekel, Anatoly A. Snigirev, Irina I. Snigireva
Author Affiliations +
Abstract
Parabolic refractive x-ray lenses with short focal distance can generate intensive hard x-ray microbeams with lateral extensions in the 100nm range even at short distance from a synchrotron radiation source. We have fabricated planar parabolic lenses made of silicon that have a focal distance in the range of a few millimeters at hard x-ray energies. In a crossed geometry, two lenses were used to generate a microbeam with a lateral size of 160nm by 115nm at 15.2keV at a distance of 47m from the synchrotron radiation source. First microdiffraction and fluorescence microtomography experiments were carried out with these lenses. Using diamond and boron as lens material, microbeams with lateral size down to 20nm and below are conceivable in the energy range from 10 to 100keV.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Christian G. Schroer, Marion Kuhlmann, Olga Kurapova, U. T. Hunger, Til Florian Gunzler, Sebastian Feste, Bruno Lengeler, Stefan Ziegler, Michael Drakopoulos, Manfred Burghammer, Christian Riekel, Anatoly A. Snigirev, and Irina I. Snigireva "Nanofocusing parabolic refractive x-ray lenses", Proc. SPIE 5539, Design and Microfabrication of Novel X-Ray Optics II, (4 November 2004); https://doi.org/10.1117/12.559931
Lens.org Logo
CITATIONS
Cited by 6 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Lenses

X-rays

Hard x-rays

Synchrotron radiation

Silicon

Luminescence

Diffraction

RELATED CONTENT

Hard x ray nanofocusing with refractive x ray optics ...
Proceedings of SPIE (September 27 2013)
Progress on multi order hard x ray imaging with multilayer...
Proceedings of SPIE (September 18 2015)
Aberration-free x-ray lenses made of silicon
Proceedings of SPIE (September 15 2016)
Silicon planar parabolic lenses
Proceedings of SPIE (January 05 2001)
Hard x-ray nano-beam characterization by ptychographic imaging
Proceedings of SPIE (September 23 2011)
The GKSS beamlines at PETRA III and DORIS III
Proceedings of SPIE (September 16 2008)
A theoretical study of two dimensional point focusing by two...
Proceedings of SPIE (September 03 2008)

Back to Top