Speckle Polarization Investigated By Novel Ellipsometer

Joseph Shamir

doi:10.1117/12.949528

25 November 1985 Speckle Polarization Investigated By Novel Ellipsometer

Joseph Shamir

Proceedings Volume 0556, Intl Conf on Speckle; (1985) https://doi.org/10.1117/12.949528
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

A novel ellipsometric method is introduced for the analysis of speckle patterns. The method is based on the illumination of the scattering object by a plane-polarized light beam with its polarization plane rotating. The speckle pattern produced by the scattered light is then investigated for its polarization characteristics. An approximate theory is outlined and compared with experimental measurements demonstrating the usefulness of the method as a powerful surface analytic tool.

Citation Download Citation

Joseph Shamir "Speckle Polarization Investigated By Novel Ellipsometer", Proc. SPIE 0556, Intl Conf on Speckle, (25 November 1985); https://doi.org/10.1117/12.949528

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