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20 January 2005 Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity
Jinhuan Li, Osami Sasaki, Takamasa Suzuki
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Proceedings Volume 5633, Advanced Materials and Devices for Sensing and Imaging II; (2005) https://doi.org/10.1117/12.576666
Event: Photonics Asia, 2004, Beijing, China
Abstract
A method is proposed for accurately measuring a sectional profile of a thread gauge. In this method a sinusoidally vibrating sinusoidal intensity (SVSI) is used to generate an exact spatial scale along one direction. Lights from top points of a thread gauge surface are extracted by spatial filtering in an afocal imaging system to form an image of the top points. A time-varying signal is detected in the image, and a sectional profile of the thread gauge is measured from the phase of the detected signal on a position where the amplitude of the signal has a maximum value. Detection of the amplitude and the phase is carried out easily and exactly with sinusoidal phase-modulating interferometry.
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Jinhuan Li, Osami Sasaki, and Takamasa Suzuki "Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity", Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); https://doi.org/10.1117/12.576666
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KEYWORDS
Signal detection
CCD image sensors
Imaging systems
Image sensors
Mirrors
Collimation
Interferometry
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