Effect of deposition method and substrate surface quality on laser-induced damage threshold for repetitive 13-ns and 130-fs pulses

Andrius Melninkaitis; Tomas Rakickas; Darius Miksys; Rimantas Grigonis; Valdas Sirutkaitis; Alfridas Skrebutenas; Rytis Buzelis; Ramutis Drazdys; Giedrius Abromavicius; Remigijus Juskenas; Algirdas Selskis

doi:10.1117/12.585300

21 February 2005 Effect of deposition method and substrate surface quality on laser-induced damage threshold for repetitive 13-ns and 130-fs pulses

Andrius Melninkaitis, Tomas Rakickas, Darius Miksys, Rimantas Grigonis, Valdas Sirutkaitis, Alfridas Skrebutenas, Rytis Buzelis, Ramutis Drazdys, Giedrius Abromavicius, Remigijus Juskenas, Algirdas Selskis

Author Affiliations +

Proceedings Volume 5647, Laser-Induced Damage in Optical Materials: 2004; (2005) https://doi.org/10.1117/12.585300
Event: Boulder Damage Symposium XXXVI, 2004, Boulder, Colorado, United States

Abstract

A comparison of laser induced damage thresholds (LIDT) of ion assisted deposition (IAD) and standard electron beam deposition dielectric coatings on BK7 glass with different surface roughness was performed. Five types of high reflectance mirrors at 800 nm and two types of high reflectance mirrors at 1064 nm were tested. Mirror coatings were made of ZrO₂ and SiO₂. Automated LIDT measurements were performed according to the requirements of current ISO 11254-2 standard. Two lasers were used for the measurements: Nd:YAG (l = 1064 nm, t = 13 ns) and Ti:Sapphire (l = 800 nm, t = 130 fs ). All measurements were performed at 1-kHz pulse repetition rate (S-on-1 test). A fixed spot size was used for each laser. For 1064 nm it was ~ 70 um and for 800 nm ~ 500 um. The damage morphology and structure of coatings were characterized by an atomic force microscopy (AFM), Nomarski microscopy and X-ray diffraction (XRD).

Citation Download Citation

Andrius Melninkaitis, Tomas Rakickas, Darius Miksys, Rimantas Grigonis, Valdas Sirutkaitis, Alfridas Skrebutenas, Rytis Buzelis, Ramutis Drazdys, Giedrius Abromavicius, Remigijus Juskenas, and Algirdas Selskis "Effect of deposition method and substrate surface quality on laser-induced damage threshold for repetitive 13-ns and 130-fs pulses", Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005); https://doi.org/10.1117/12.585300

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available