Influence of annealing on the nanosecond laser damage resistance of the dielectric mirror coatings at 1064-nm prepared by IBS

Tao Wang; Hongbo He; Yuanan Zhao; Jianda Shao; Zhengxiu Fan

doi:10.1117/12.607467

8 December 2004 Influence of annealing on the nanosecond laser damage resistance of the dielectric mirror coatings at 1064-nm prepared by IBS

Tao Wang, Hongbo He, Yuanan Zhao, Jianda Shao, Zhengxiu Fan

Author Affiliations +

Proceedings Volume 5774, Fifth International Conference on Thin Film Physics and Applications; (2004) https://doi.org/10.1117/12.607467
Event: Fifth International Conference on Thin Film Physics and Applications, 2004, Shanghai, China

Abstract

Laser induced damage of multilayer has been investigated at different annealing temperatures. Ta₂O₅/SiO₂ dielectric mirror coatings for 1064nm were prepared by ion beam sputtering (IBS), and then annealed in air at 250 centigrade and 350 centigrade, respectively. The microstructure of the samples was characterized by X-Ray diffraction (XRD). Absorption of the multilayer was measured by surface thermal lensing (STL) technique. Single-shot laser-induced damage threshold (LIDT) was assessed using 1064 nm Q-switched pulsed laser at a pulse length of 12ns. It was found that the center wavelength shifted to a longer wavelength as the annealing temperature increased. However, the samples kept its non-crystalline structure even after annealing. The absorbance of the samples decreased after annealing. An obvious decrease of the single-shot laser-induced damage threshold was found after annealing. Optical microscopy was employed in mapping laser-induced damage morphology features after laser irradiation.

Citation Download Citation

Tao Wang, Hongbo He, Yuanan Zhao, Jianda Shao, and Zhengxiu Fan "Influence of annealing on the nanosecond laser damage resistance of the dielectric mirror coatings at 1064-nm prepared by IBS", Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); https://doi.org/10.1117/12.607467

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available