Paper
14 February 2005 Corner cube model for Microarcsec Metrology (MAM) testbed in Space Interferometer Mission (SIM)
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Proceedings Volume 5776, Eighth International Symposium on Laser Metrology; (2005) https://doi.org/10.1117/12.611625
Event: Eighth International Conference on Laser Metrology, 2005, Merida, Mexico
Abstract
A corner cube model is developed to calculate the SIM internal metrology optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, coating index error, dihedral error, and gimbal offset. This physics-based and Matlab-implemented ray-trace model provides useful guidance on the flight system design, integration, and characterization. In this paper, the details of the corner cube model will be described first. Then the sub-nanometer level model validation through the MAM testbed will be presented. Finally several examples of the model application, such as the metrology delay bias minimization, design parameter error budget (or tolerance) allocation, and the metrology beam prints visualization, will be shown.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xu Wang "Corner cube model for Microarcsec Metrology (MAM) testbed in Space Interferometer Mission (SIM)", Proc. SPIE 5776, Eighth International Symposium on Laser Metrology, (14 February 2005); https://doi.org/10.1117/12.611625
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KEYWORDS
Metrology

Reflection

Data modeling

Error analysis

Interferometers

Coating

Data processing

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