Paper
28 June 2005 Flexible sparse and dense OPC algorithms
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Abstract
In this paper, we distinguish between sparse and dense simulation. We give a background on known sparse and dense simulation techniques. We propose a new “semi-dense” OPC technique which is between standard sparse, and fully dense OPC. We also discuss a fully dense OPC algorithm, in which full image grids are used to control the OPC corrections. Finally, we discuss dense verification to ensure good printing behavior through process window on the full image.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nick Cobb "Flexible sparse and dense OPC algorithms", Proc. SPIE 5853, Photomask and Next-Generation Lithography Mask Technology XII, (28 June 2005); https://doi.org/10.1117/12.617198
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CITATIONS
Cited by 15 scholarly publications and 36 patents.
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KEYWORDS
Optical proximity correction

Printing

Photomasks

System on a chip

Computer simulations

Convolution

Tolerancing

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