Modeling and characterization of adaptive microlenses: device simulation

Yasser A. Abdelaziez; Partha P. Banerjee

doi:10.1117/12.617682

18 August 2005 Modeling and characterization of adaptive microlenses: device simulation

Yasser A. Abdelaziez, Partha P. Banerjee

Proceedings Volume 5874, Current Developments in Lens Design and Optical Engineering VI; 58740D (2005) https://doi.org/10.1117/12.617682
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

We here report on the modeling and characterization of adaptive microlenses. We first address device simulation with the theoretical treatment of its characterization. A follow-up paper addresses the experimental results of the focal length measurements using a simple Z-scan method. In addition, the sources of error and ways to overcome them are discussed. Previously, an adjustable electro-optic microlens with concentric electrodes was presented. The electrostatic potential was found by numerically solving Laplace's equation where the surface charge method was incorporated. The refractive index distribution within the lens aperture and the effective light path modulation was found by integration over the entire substrate thickness. We have used finite element analysis to characterize the electrostatic field distribution within the lens aperture. Unlike the previous theoretical treatment, we implement the beam propagation method to calculate the total phase delay. This will allow for accurately modeling the phase based on the optical field profile, medium inhomogeneties, and scattering and depolarization effects. Furthermore, we represent the theoretical basis for characterizing such types of lenses, and microlenses in general. In this method, we implement Fresnel diffraction and a simple Z-scan method. This technique allows for finding the lens focal length, and its sign, and study aberration effects as well.

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Yasser A. Abdelaziez and Partha P. Banerjee "Modeling and characterization of adaptive microlenses: device simulation", Proc. SPIE 5874, Current Developments in Lens Design and Optical Engineering VI, 58740D (18 August 2005); https://doi.org/10.1117/12.617682

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KEYWORDS

Microlens

Refractive index

Electro optical modeling

Electrodes

Beam propagation method

Electro optics

Finite element methods

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