Super-resolution x-ray imaging by CdTe discrete detector arrays

T. Aoki; Y. Ishida; H. Morii; Y. Tomita; G. Ohashi; J. Temmyo; Y. Hatanaka

doi:10.1117/12.616887

16 September 2005 Super-resolution x-ray imaging by CdTe discrete detector arrays

T. Aoki, Y. Ishida, H. Morii, Y. Tomita, G. Ohashi, J. Temmyo, Y. Hatanaka

Proceedings Volume 5922, Hard X-Ray and Gamma-Ray Detector Physics VII; 59220T (2005) https://doi.org/10.1117/12.616887
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

512-pixel CdTe super-liner imaging scanner was developed. This device was consist with 512 chips of M-π-n CdTe diode detector fabricated by excimer laser doping process, 8 chips of photon-counting mode 64ch ASIC with FPGA circuit, USB2.0 interface with 1-CPU. It has 5 discriminated levels and over 2Mcps count rate for X-ray penetration imaging. This imaging scanner has 512 discrete CdTe chips for detector arrays with the length of 2.0mm, width of 0.8mm and thickness of 0.5mm. These chips were mounted in four plover array rows for high-resolution imaging with 0.5mm-pitch, therefore the pixel pitch was over the pixel width. When images were taken with scanning system with this arrays, we could obtain over-resolution than pixel width. In this paper, this "over-resolution" imaging will be called "super resolution imaging". In high-resolution imaging device, the pixel devices on one substrate were formed by integrated process, or many discrete detector chips were installed on circuit board, usually. In the latter case, it is easer to make each detector chips than former case, and it are no need to consider charge sharing phenomena compare with one-chip pixel devices. However, a decrease in pixel pitch makes the mount to the detector chip to the ASIC board difficult because the handling will also be difficult The super-resolution technique in this scanner by pixel-shift method for X-ray imaging is shown in this paper

Citation Download Citation

T. Aoki, Y. Ishida, H. Morii, Y. Tomita, G. Ohashi, J. Temmyo, and Y. Hatanaka "Super-resolution x-ray imaging by CdTe discrete detector arrays", Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220T (16 September 2005); https://doi.org/10.1117/12.616887

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available