A contrast between DLP and LCD digital projection technology for triangulation-based phase measuring optical profilometers

Matthew J. Baker; Jiangtao Xi; Joe Chicharo; Enbang Li

doi:10.1117/12.632582

7 November 2005 A contrast between DLP and LCD digital projection technology for triangulation based phase measuring optical profilometers

Matthew J. Baker, Jiangtao Xi, Joe Chicharo, Enbang Li

Author Affiliations +

Proceedings Volume 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III; 60000G (2005) https://doi.org/10.1117/12.632582
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

With the growing demand for high speed and dynamic 3D profiling for applications such as animation, face recognition and machine vision, we have seen Digital Video Projection (DVP) emerge as the preferred projection technology. In addition to the robust qualities DVP sources offer, many researchers are adopting the technology on the merits of higher resolutions, contrast ratios and sharper images, all of which are characteristic of the highly developing projection technology. However, in regard to the specific application of triangulation based optical profilometers, DVP lacks predominantly in pattern geometric structure and also suffers from colour channel coupling issues. The purpose of this paper is to review the functionality and contrast the two chief DVP technologies, Liquid Crystal Display (LCD) and Digital Light Processing (DLP) from the specific viewpoint of a triangulation based phase measuring profilometer. Experimental verification of the performance of each projection technology is provided and finally some suggestions on projection technologies for single and multichannel phase measuring profilometry applications is offered.

Citation Download Citation

Matthew J. Baker, Jiangtao Xi, Joe Chicharo, and Enbang Li "A contrast between DLP and LCD digital projection technology for triangulation based phase measuring optical profilometers", Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000G (7 November 2005); https://doi.org/10.1117/12.632582

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