Effect of the radiation reaction force on infrared signals from the apertureless near field scanning optical microscopy technique

Mark P. J. L. Chang; Erick A. Roura

doi:10.1117/12.630871

17 November 2005 Effect of the radiation reaction force on infrared signals from the apertureless near field scanning optical microscopy technique

Mark P. J. L. Chang, Erick A. Roura

Author Affiliations +

Proceedings Volume 6008, Nanosensing: Materials and Devices II; 60081I (2005) https://doi.org/10.1117/12.630871
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

We explore the effect of a newly discovered mechanism on the detection of infrared radiation using Apertureless Near Field Scanning Optical Microscopy (ANSOM). The passage of the ANSOM tip over a sample surface is modelled as a dipole moving over a halfspace. A boundary induced excitation is shown to occur, related to the retarded radiation reaction force of the dipole close to the surface. This excitation modifies the spontaneous emission characteristics of the dipole as it alters the near field. We suggest that this physical effect can cause emission at detectable levels in the infrared region thereby altering the expected signal in a typical ANSOM setup.

Citation Download Citation

Mark P. J. L. Chang and Erick A. Roura "Effect of the radiation reaction force on infrared signals from the apertureless near field scanning optical microscopy technique", Proc. SPIE 6008, Nanosensing: Materials and Devices II, 60081I (17 November 2005); https://doi.org/10.1117/12.630871

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