Paper
2 December 2005 Subtraction of S-parameters for adiabatic small-signal modulation characteristics of laser diode
Shang Jian Zhang, Ji Min Wen, Hai Peng Song, Ning Hua Zhu
Author Affiliations +
Proceedings Volume 6020, Optoelectronic Materials and Devices for Optical Communications; 60201V (2005) https://doi.org/10.1117/12.636504
Event: Asia-Pacific Optical Communications, 2005, Shanghai, China
Abstract
An extended subtraction method of scattering parameters for characterizing laser diode is introduced in this paper. The intrinsic small-signal response can be directly extracted from the measured transmission coefficients of laser diode by the method. However the chip temperature may change with the injection bias current due to thermal effects, which causes inaccurate intrinsic response by our method. Therefore, how to determine the chip temperature and keep the laser chip adiabatic is very critical when extracting the intrinsic response. To tackle these problems, the dependence of the lasing wavelength of the laser diode on the chip temperature is investigated, and an applicable measurement setup which keeps the chip temperature stable is presented. The scattering parameters of laser diode are measured on diabatic and adiabatic conditions, and the extracted intrinsic responses for both conditions are compared. It is found that the adiabatic intrinsic responses are evidently superior to those without thermal consideration. The analysis indicates that inclusion of thermal effects is necessary to acquire accurate intrinsic response.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shang Jian Zhang, Ji Min Wen, Hai Peng Song, and Ning Hua Zhu "Subtraction of S-parameters for adiabatic small-signal modulation characteristics of laser diode", Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60201V (2 December 2005); https://doi.org/10.1117/12.636504
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KEYWORDS
Semiconductor lasers

Temperature metrology

Laser scattering

Scattering

Thermal effects

Modulation

Calibration

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