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21 March 2006 Rapid reverse engineering system of a free surface
Qunying Liu, Jing Zhang
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Proceedings Volume 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials; 60400M (2006) https://doi.org/10.1117/12.664164
Event: ICMIT 2005: Merchatronics, MEMS, and Smart Materials, 2005, Chongqing, China
Abstract
Measuring the shape of a model is important for reverse engineering. The rapid measurement of a free surface and the rapid reconstruction of graphics has been studied. The rectangle grating projection method was applied to the rapid measurement of the free surface of an object. Fourier transforms of a light field in which rectangular gratings were projected on a measured free surface was processed. Phase offset was acquired by computing the modulated raster phase distribution of the measured free surface and a reference plane. As a result, by analysis of the light route of the rectangular grating projection, the relation between phase offset and height of measured free surface was acquired. Sequentially, the height information of the measured object was computed. For rapid reconstruction, a rectangle region of each scatter data point on the parameter plane was constructed. The coordinates of each grating point were computed from the region boundary and the grating space. The measured scattered data were interpolated with a special Hermite algorithm, and the height of each grating point in each functionary field was computed. The new surface with rectangle gridding was formed by the accumulation of several overlapped rectangles. The method was applied to the rapid reverse engineering of an automobile engine cover, and shown to result in great improvement.
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Qunying Liu and Jing Zhang "Rapid reverse engineering system of a free surface", Proc. SPIE 6040, ICMIT 2005: Mechatronics, MEMS, and Smart Materials, 60400M (21 March 2006); https://doi.org/10.1117/12.664164
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KEYWORDS
Reverse engineering
Visualization
Reverse modeling
Computer aided design
Modulation
Raster graphics
Scatter measurement
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