Paper
28 February 2006 Unified model of femtosecond laser ionization in bulk solid dielectrics
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Abstract
Ionization dynamics based on various ionization and carrier-loss mechanisms is theoretically studied for bulk crystalline and amorphous solid dielectrics irradiated by ultrashort (femtosecond) laser pulses. Multi-photon ionization is found to be predominant at low laser intensities (Ilas ∼ 10 TW/cm2) with small contribution of avalanche process, which is more significant for amorphous, rather than crystalline materials. At higher intensities - Ilas ~ 102 TW/cm2 - ionization is considerably enhanced by transient bandgap renormalization due to ultrafast ac-Stark effect and multi-particle interactions in electron-hole plasma, but is strongly damped by Auger recombination for electron-hole plasma densities Ne > 1020 cm-3 and accompanied by microscopic damage of corresponding dielectric materials.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergey I. Kudryashov "Unified model of femtosecond laser ionization in bulk solid dielectrics", Proc. SPIE 6108, Commercial and Biomedical Applications of Ultrafast Lasers VI, 61080N (28 February 2006); https://doi.org/10.1117/12.646660
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Cited by 2 scholarly publications.
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KEYWORDS
Ionization

Dielectrics

Artificial intelligence

Solids

Femtosecond phenomena

Crystals

Autoregressive models

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