Microscopic emission properties of nonpolar <i>&#945;</i>-plane GaN grown by HVPE

T. Paskova; R. Kroeger; P. P. Paskov; S. Figge; D. Hommel; B. Monemar; B. Haskell; P. Fini; J. S. Speck; S. Nakamura

doi:10.1117/12.645672

3 March 2006 Microscopic emission properties of nonpolar α-plane GaN grown by HVPE

T. Paskova, R. Kroeger, P. P. Paskov, S. Figge, D. Hommel, B. Monemar, B. Haskell, P. Fini, J. S. Speck, S. Nakamura

Proceedings Volume 6121, Gallium Nitride Materials and Devices; 612106 (2006) https://doi.org/10.1117/12.645672
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

We have studied the emission distributions in nonpolar α-plane GaN thick films grown by HVPE using different nucleation schemes. The emission spectra show in addition to the near band edge emission band, also defect related bands due to different structural defects being enhanced/reduced to different extent in samples grown on different templates. Spatially resolved cathodoluminescence imaging reveals the in-plane distributions of the respective emission bands, which allows us to correlate the emissions with particular stacking fault structural defects independently revealed by plan-view transmission electron microscopy. In addition, emission distributions were visualized in vicinity of largescale defects like surface triangle pits, depressions and cracks attributed to prevailing defect formation and/or impurity incorporation.

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T. Paskova, R. Kroeger, P. P. Paskov, S. Figge, D. Hommel, B. Monemar, B. Haskell, P. Fini, J. S. Speck, and S. Nakamura "Microscopic emission properties of nonpolar α-plane GaN grown by HVPE", Proc. SPIE 6121, Gallium Nitride Materials and Devices, 612106 (3 March 2006); https://doi.org/10.1117/12.645672

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