Paper
11 April 2006 Microlens formation using heavily dyed photoresist in a single step
Chris Cox, Curtis Planje, Nick Brakensiek, Zhimin Zhu, Jonathan Mayo
Author Affiliations +
Abstract
The work described here produced a new method of forming microlenses which requires fewer processing steps, eliminates the need for reflow or photoresist etching steps, and can be used with an inexpensive mask to form arrays. In this new method, a strongly absorbing dye is added in high percentage to a normal positive i-line photoresist. This photoresist is then processed at a much higher exposure dose than the normal photoresist. This paper describes simulated microlens structures as predicted by PROLITH as well as actual lens structures that were produced with the new method. This newly developed method is designed to enable the formation of microlenses at significant cost savings and with increased process control.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chris Cox, Curtis Planje, Nick Brakensiek, Zhimin Zhu, and Jonathan Mayo "Microlens formation using heavily dyed photoresist in a single step", Proc. SPIE 6153, Advances in Resist Technology and Processing XXIII, 61534E (11 April 2006); https://doi.org/10.1117/12.654531
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CITATIONS
Cited by 3 scholarly publications and 2 patents.
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KEYWORDS
Photoresist materials

Microlens

Refractive index

Etching

Silicon

Photomasks

Photoresist developing

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