Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices

Neeta Agarwal; Lee M. Goldman; Suri Sastri; Robert Ondercin; Paul Kobrin

doi:10.1117/12.720202

14 May 2007 Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices

Neeta Agarwal, Lee M. Goldman, Suri Sastri, Robert Ondercin, Paul Kobrin

Author Affiliations +

Proceedings Volume 6542, Infrared Technology and Applications XXXIII; 65422B (2007) https://doi.org/10.1117/12.720202
Event: Defense and Security Symposium, 2007, Orlando, Florida, United States

Abstract

Space based HgCdTe imaging devices, built on CdZnTe substrates, require radiation hardened anti-reflection (AR) treatments in order to withstand the rigors of the space environment. Conventional anti-reflection (AR) coatings provide adequate optical performance but are prone to delamination and degradation due to extreme temperature cycling and irradiation in space. Consequently, there is an intense need for improved AR technology that combines high optical performance with improved durability. Etching physical gradient or motheye structures directly into the CdZnTe eliminates the need to deposit additional layers of different materials onto the substrate, avoiding the possibility of delamination and cross contamination. Motheye AR surfaces, under development at Surmet Corporation, have demonstrated excellent broadband optical performance in the LWIR (7 to14 micron) waveband. Surmet's motheye technology involves direct etching of a regular pattern of fine features into the CdZnTe substrate, using standard lithography and dry etching techniques. The results from this ongoing research and development effort are discussed.

Citation Download Citation

Neeta Agarwal, Lee M. Goldman, Suri Sastri, Robert Ondercin, and Paul Kobrin "Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices", Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 65422B (14 May 2007); https://doi.org/10.1117/12.720202

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available