Qualitative characterization of YBa2Cu3O7-&#948; films using low spectral resolution Raman spectroscopy

M. Branescu; I. Morjan; F. Dumitrache; I. Sandu

doi:10.1117/12.729507

25 April 2007 Qualitative characterization of YBa₂Cu₃O_7-δ films using low spectral resolution Raman spectroscopy

M. Branescu, I. Morjan, F. Dumitrache, I. Sandu

Proceedings Volume 6606, Advanced Laser Technologies 2006; 660618 (2007) https://doi.org/10.1117/12.729507
Event: Advanced Laser Technologies 2006, 2006, Brasov, Romania

Abstract

We describe our low spectral resolution Raman system that allows us to directly appreciate the quality of YBa₂Cu₃O_7-δ (YBCO) films, obtained by pulsed laser deposition on LaAlO₃ substrate. We identify the basic features of YBCO films' spectral fingerprints, validated by high spectral resolution analysis, described in previous reports. This fast and nondestructive valuable analytical tool functions at a convenient time and environment after deposition.

Citation Download Citation

M. Branescu, I. Morjan, F. Dumitrache, and I. Sandu "Qualitative characterization of YBa₂Cu₃O_7-δ films using low spectral resolution Raman spectroscopy", Proc. SPIE 6606, Advanced Laser Technologies 2006, 660618 (25 April 2007); https://doi.org/10.1117/12.729507

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