Measurements of adsorption strain in porous silicon by Raman scattering

M. A. Ferrara; L. Sirleto; G. Messina; M. G. Donato; S. Santangelo; I. Rendina

doi:10.1117/12.738402

2 July 2007 Measurements of adsorption strain in porous silicon by Raman scattering

M. A. Ferrara, L. Sirleto, G. Messina, M. G. Donato, S. Santangelo, I. Rendina

Proceedings Volume 6619, Third European Workshop on Optical Fibre Sensors; 661913 (2007) https://doi.org/10.1117/12.738402
Event: Third European Workshop on Optical Fibre Sensors, 2007, Napoli, Italy

Abstract

The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.

Citation Download Citation

M. A. Ferrara, L. Sirleto, G. Messina, M. G. Donato, S. Santangelo, and I. Rendina "Measurements of adsorption strain in porous silicon by Raman scattering", Proc. SPIE 6619, Third European Workshop on Optical Fibre Sensors, 661913 (2 July 2007); https://doi.org/10.1117/12.738402

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