Paper
11 September 2007 Auto-scanning white-light interferometer
Author Affiliations +
Abstract
This study proposes the auto-focusing procedure and the scan-range determining algorithm for white-light scanning interferometry. During white-light scanning interferometry, the interference fringe must be located and to the best-focus interferogram identified. The vertical-scan range must also be determined prior to the scanning procedure. A series of images, either in-focus or out-of-focus, are collected in a proposed interference-fringe searching step. The contrast and the sharpness indices of each image are calculated and applied in the auto-focusing scheme, and the vertical-scan range is determined accordingly. Some preliminary experiments are performed to demonstrate that the best-focus interferogram can be located precisely and the vertical-scan range can be determined.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin-Liang Chen, Chi-Hong Tung, Ching-Fen Kao, and Calvin C. Chang "Auto-scanning white-light interferometer", Proc. SPIE 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III, 667204 (11 September 2007); https://doi.org/10.1117/12.733625
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Cited by 1 scholarly publication.
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KEYWORDS
Beam splitters

Calibration

Charge-coupled devices

Interferometers

Interferometry

Light sources

Actuators

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