Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope

J. P. Lehan; S. Owens; T. Hadjimichael; M. Hong; K.-W. Chan; T. T. Saha; P. Reid; W. W. Zhang

doi:10.1117/12.733080

3 October 2007 Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope

J. P. Lehan, S. Owens, T. Hadjimichael, M. Hong, K.-W. Chan, T. T. Saha, P. Reid, W. W. Zhang

Author Affiliations +

Proceedings Volume 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III; 668818 (2007) https://doi.org/10.1117/12.733080
Event: Optical Engineering + Applications, 2007, San Diego, California, United States

Abstract

We present an overview update of the metrologic approach to be employed for the segmented mirror fabrication for Constellation-X spectroscopy x-ray telescope. We compare results achieved to date with mission requirements. This is discussed in terms of inherent capability versus in-practice capability. We find that all the needed metrics for the mirrors are in hand but that they are currently limited by the mounting of the mirrors themselves.

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J. P. Lehan, S. Owens, T. Hadjimichael, M. Hong, K.-W. Chan, T. T. Saha, P. Reid, and W. W. Zhang "Toward a complete metrologic solution for the mirrors for the Constellation-X Spectroscopy x-ray telescope", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 668818 (3 October 2007); https://doi.org/10.1117/12.733080

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