Paper
20 September 2007 Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes
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Abstract
The task of designing high performance X-ray optical systems requires the development of sophisticated X-ray scattering calculations based on rigorous information about the optics. One of the most insightful approaches to these calculations is based on the power spectral density (PSD) distribution of the surface height. The major problem of measurement of a PSD distribution with an interferometric and/or atomic force microscope arises due to the unknown Modulation Transfer Function (MTF) of the instruments. The MTF characterizes the perturbation of the PSD distribution at higher spatial frequencies. Here, we describe a new method and dedicated test surfaces for calibration of the MTF of a microscope. The method is based on use of a specially designed Binary Pseudo-random (BPR) grating. Comparison of a theoretically calculated PSD spectrum of a BPR grating with a spectrum measured with the grating provides the desired calibration of the instrumental MTF. The theoretical background of the method, as well as results of experimental investigations are presented.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Valeriy V. Yashchuk, Wayne R. McKinney, and Peter Z. Takacs "Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes", Proc. SPIE 6704, Advances in Metrology for X-Ray and EUV Optics II, 670408 (20 September 2007); https://doi.org/10.1117/12.732557
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Cited by 18 scholarly publications.
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KEYWORDS
Modulation transfer functions

Microscopes

Binary data

Interferometry

Calibration

Spatial frequencies

Objectives

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