Sensitivity of magneto-optic method for measuring beat-length of high birefringence optical fiber

Huan-Huan Bao; Zhi-Dong Shi; Jian-Qiang Lin; Shu Liu; Xue-Nong Xiang

doi:10.1117/12.783584

17 January 2008 Sensitivity of magneto-optic method for measuring beat-length of high birefringence optical fiber

Huan-Huan Bao, Zhi-Dong Shi, Jian-Qiang Lin, Shu Liu, Xue-Nong Xiang

Proceedings Volume 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 672340 (2008) https://doi.org/10.1117/12.783584
Event: 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes, 2007, Chengdu, China

Abstract

Examined is the influence by input state of polarization and analyzing scheme on sensitivity in the measurement system of beat length that relies on magneto-optic modulation technique in which the magnetic gap and intensity of magnetic field have been given. Through theoretic analysis and experimental study, it is found that there are three experiment schemes getting maximum sensitivity. First, the polarization direction of the input linearly polarized light is at θ = 0⁰ or 90⁰ to the birefringence fast axis of e fiber, at the same time, the two analyzing axes of Wollaston prism are at γ = 45⁰ to the birefringence fast or slow axis of fiber. Second, the polarization direction of input linearly polarized light is at θ = 45⁰, and γ = 0⁰ or 90⁰. Third, the input light beam is circular polarized light, at the same time, γ = 0⁰ or 90⁰. The sensitivity under three cases is approximately equal, but the third scheme needn't pinpoint the direction of birefringence axis of fiber, which makes the experiment more convenient and avoid the measurement error caused by the adjustment of angle.

Citation Download Citation

Huan-Huan Bao, Zhi-Dong Shi, Jian-Qiang Lin, Shu Liu, and Xue-Nong Xiang "Sensitivity of magneto-optic method for measuring beat-length of high birefringence optical fiber", Proc. SPIE 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 672340 (17 January 2008); https://doi.org/10.1117/12.783584

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