Study on the model for wheat yield based on the electromagnetism information sources of ground objects and environments

Yan Tian; Xin Zhan

doi:10.1117/12.775006

10 November 2007 Study on the model for wheat yield based on the electromagnetism information sources of ground objects and environments

Yan Tian, Xin Zhan

Author Affiliations +

Proceedings Volume 6795, Second International Conference on Space Information Technology; 67953T (2007) https://doi.org/10.1117/12.775006
Event: Second International Conference on Spatial Information Technology, 2007, Wuhan, China

Abstract

By analysis the model for wheat yield, the information sources of the wheat yield were obtained. Based on the discussion for the relationship between electromagnetism information sources and yield factors of wheat, the methods to calculate each yield factor of wheat are given and then provided the implementation and calculating procedures of yield model for wheat. The most contribution of this paper is to present a novel theory---matter Electromagnetism Information Source which has widely applications in both theory and practice.

Citation Download Citation

Yan Tian and Xin Zhan "Study on the model for wheat yield based on the electromagnetism information sources of ground objects and environments", Proc. SPIE 6795, Second International Conference on Space Information Technology, 67953T (10 November 2007); https://doi.org/10.1117/12.775006

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