Study on the degradation of PLEDs by in-situ micro-Raman spectroscopy

Xiaoxuan Xu; Zhe Qin; Haibo Lin; Wei Xu

doi:10.1117/12.768383

14 January 2008 Study on the degradation of PLEDs by in-situ micro-Raman spectroscopy

Xiaoxuan Xu, Zhe Qin, Haibo Lin, Wei Xu

Proceedings Volume 6828, Light-Emitting Diode Materials and Devices II; 68280R (2008) https://doi.org/10.1117/12.768383
Event: Photonics Asia 2007, 2007, Beijing, China

Abstract

Electro luminescence spectra and in-suit micro-Raman spectra was used to study voltaic aging of organic light emitting devices with two kinds of conjugated macromolecule polymer emission layer, one is called PFO-BT15 and the other is poly (2-(4-Ethylhexyl) phenyl-1 , 4-phenylene vinylene) (P-PPV) polymer. The first device has a configuration of ITO glass/ PEDOT( 120nm ) PFO-BT15(80nm)/Ba( 4nm )/Al(200nm) , and we encapsulated the cathode of diode with epoxy resin to reduce the entrance of oxygen and water. After long time current stress, the electro luminescent spectra and Raman spectra show that the polymer device's molecular configuration of polymer layer is unchanged , but the PEDOT anode's breakage which lead to the emission failure of the device, which indicates that this kind of polymer materials have relatively steady photoelectric performance . The second device, during current stress , the reduction of conjugation length is provided by Raman spectroscopy. This reduction of the conjugation length , which dramatically increases the resistance and cuts off the current density , was the main reason for the failure of lighting. These findings provide an important insight into the intrinsic degradation mechanisms of the polymer LEDs and help in the development of even more stable devices.

Citation Download Citation

Xiaoxuan Xu, Zhe Qin, Haibo Lin, and Wei Xu "Study on the degradation of PLEDs by in-situ micro-Raman spectroscopy", Proc. SPIE 6828, Light-Emitting Diode Materials and Devices II, 68280R (14 January 2008); https://doi.org/10.1117/12.768383

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