Mark Beals,1 J. Michel,1 J. F. Liu,1 D. H. Ahn,1 D. Sparacin,1 R. Sun,1 C. Y. Hong,1 L. C. Kimerling,1 A. Pomerene,2 D. Carothers,2 J. Beattie,2 A. Kopa,3 A. Apsel,3 M. S. Rasras,4 D. M. Gill,4 S. S. Patel,4 K. Y. Tu,4 Y. K. Chen,4 A. E. White4
1Massachusetts Institute of Technology (United States) 2BAE Systems (United States) 3Cornell Univ. (United States) 4Lucent Technologies Bell Labs. (United States)
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Multilevel thin film processing, global planarization and advanced photolithography enables the ability to integrate
complimentary materials and process sequences required for high index contrast photonic components all within a single
CMOS process flow. Developing high performance photonic components that can be integrated with electronic circuits
at a high level of functionality in silicon CMOS is one of the basic objectives of the EPIC program sponsored by the
Microsystems Technology Office (MTO) of DARPA. Our research team consisting of members from: BAE Systems,
Alcatel-Lucent, Massachusetts Institute of Technology, Cornell University and Applied Wave Research reports on the
latest developments of the technology to fabricate an application specific, electronic-photonic integrated circuit
(AS_EPIC).
Now in its second phase of the EPIC program, the team has designed, developed and integrated fourth order optical
tunable filters, both silicon ring resonator and germanium electro-absorption modulators and germanium pin diode
photodetectors using silicon waveguides within a full 150nm CMOS process flow for a broadband RF channelizer
application. This presentation will review the latest advances of the passive and active photonic devices developed and
the processes used for monolithic integration with CMOS processing. Examples include multilevel waveguides for
optical interconnect and germanium epitaxy for active photonic devices such as p-i-n photodiodes and modulators.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Mark Beals, J. Michel, J. F. Liu, D. H. Ahn, D. Sparacin, R. Sun, C. Y. Hong, L. C. Kimerling, A. Pomerene, D. Carothers, J. Beattie, A. Kopa, A. Apsel, M. S. Rasras, D. M. Gill, S. S. Patel, K. Y. Tu, Y. K. Chen, A. E. White, "Process flow innovations for photonic device integration in CMOS," Proc. SPIE 6898, Silicon Photonics III, 689804 (13 February 2008); https://doi.org/10.1117/12.774576