Paper
23 July 2008 Three bipods slicer prototype: tests and finite element calculations
T. Pamplona, Ch. Rossin, L. Martin, G. Moreaux, E. Prieto, P. Laurent, E. Grassi, J.-L. Boit, L. Castinel, J. Garcia, B. Milliard
Author Affiliations +
Abstract
For integral field spectroscopy R&D activities in progress at LAM, and particularly in relation with SNAP - SuperNova/Acceleration Probe - spectrograph, LAM has an on-going program to qualify Image Slicers for space instrumentation. In this context, an optomechanical concept of an image slicer supported by three bipods has been designed, realized and tested at the laboratory. This paper presents the mechanical design of the invar mount equipped with three bipods and supporting an assembly of 60 thin zerodur slices tied together thanks to optical contact. We document the design improvement made from last blades flexures prototype and we describe all the tests conducted on this new prototype: optical contact tests, vibration tests and thermal cycles. Thanks to a detailed FEM analysis on this three bipods concept, we correlate simulations with tests.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Pamplona, Ch. Rossin, L. Martin, G. Moreaux, E. Prieto, P. Laurent, E. Grassi, J.-L. Boit, L. Castinel, J. Garcia, and B. Milliard "Three bipods slicer prototype: tests and finite element calculations", Proc. SPIE 7018, Advanced Optical and Mechanical Technologies in Telescopes and Instrumentation, 701828 (23 July 2008); https://doi.org/10.1117/12.789243
Lens.org Logo
CITATIONS
Cited by 8 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Prototyping

Finite element methods

Sensors

Zerodur

Optical testing

Interfaces

Optical alignment

RELATED CONTENT

The crossed-sine wavefront sensor: first tests and results
Proceedings of SPIE (August 29 2022)
The design of the cryostat for ELT/METIS
Proceedings of SPIE (December 13 2020)
Common interface visible sensor
Proceedings of SPIE (July 12 2019)
Demonstration of an ion-figuring process
Proceedings of SPIE (November 01 1990)

Back to Top