An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures

Jinan Zeng; Leonard Hanssen

doi:10.1117/12.796186

29 August 2008 An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures

Jinan Zeng, Leonard Hanssen

Proceedings Volume 7065, Reflection, Scattering, and Diffraction from Surfaces; 70650F (2008) https://doi.org/10.1117/12.796186
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

An instrument, the Complete Hemispherical Infrared Laser-based Reflectometer (CHILR), has been designed and built for the accurate characterization of the total reflectance of highly absorbing samples and cavity structures down to the level of 10^-5. The design of CHILR employs a number of the same features of Total Integrated Scatter (TIS) measurement devices, but is used for total reflectance (both specular and diffuse components), rather than only the diffuse component. A number of features of CHILR include spatial uniformity and angular dependence of reflectance measurement capability, multiple wavelength laser sources, and the ability to measure a wide range of sample sizes and cavities with aperture sizes, ranging from 3 mm to 51 mm. We address several basic issues of alignment, background and externally scattered light, reference measurement, and laser drift, for the CHILR. We also present results of several examples, including cavities for blackbody sources, and radiometer cavities.

Citation Download Citation

Jinan Zeng and Leonard Hanssen "An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures", Proc. SPIE 7065, Reflection, Scattering, and Diffraction from Surfaces, 70650F (29 August 2008); https://doi.org/10.1117/12.796186

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