A comparison of two identical SAW devices

Jack T. Sanders

doi:10.1117/12.796322

2 September 2008 A comparison of two identical SAW devices

Jack T. Sanders

Proceedings Volume 7069, Optical System Contamination: Effects, Measurements, and Control 2008; 70690I (2008) https://doi.org/10.1117/12.796322
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

Two Surface Acoustic Wave (SAW) quartz crystal microbalances were used to determine nonvolatile mass deposition from a nitrogen purge gas. The units were connected serially and both were evaluated in the first and second position. Similarities and differences will be discussed.

Citation Download Citation

Jack T. Sanders "A comparison of two identical SAW devices", Proc. SPIE 7069, Optical System Contamination: Effects, Measurements, and Control 2008, 70690I (2 September 2008); https://doi.org/10.1117/12.796322

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