Characterization and system modeling of M-pixel CMOS arrays part II

Curtis Tesdahl; Prateek Jain; David Dorn

doi:10.1117/12.805931

27 January 2009 Characterization and system modeling of M-pixel CMOS arrays part II

Curtis Tesdahl, Prateek Jain, David Dorn

Proceedings Volume 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X; 72490M (2009) https://doi.org/10.1117/12.805931
Event: IS&T/SPIE Electronic Imaging, 2009, San Jose, California, United States

Abstract

This paper is a follow-up to the paper presented at SPIE Electronic Imaging Science and Technology in San Jose, 2007, "Characterization and system modeling of a 5-Mpixel CMOS array." We expand and refined test methodologies used in the characterization and selection process of CMOS arrays targeting megapixel security camera applications. This paper presents work in the following areas: system gain, gain noise, binning noise, F-number response, system modeling, and temperature effects. Since security cameras must operate under harsh temperature extremes, performance under these conditions must be understood. Characterizations are made for the following areas: dark current, DSNU, hot pixels, clusters, temporal noise and spatial noise.

Citation Download Citation

Curtis Tesdahl, Prateek Jain, and David Dorn "Characterization and system modeling of M-pixel CMOS arrays part II", Proc. SPIE 7249, Sensors, Cameras, and Systems for Industrial/Scientific Applications X, 72490M (27 January 2009); https://doi.org/10.1117/12.805931

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