Paper
27 April 2009 Semi-empirical scattering model for chemical vapor deposited zinc sulfide
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Abstract
A model has been created based on scattering that describes the λ-2 dependence of the extinction in bulk samples of CVD ZnS. The model is a version of surface scattering from internal surfaces of layers with different refractive index. The form of the model was inspired by observation of a lamellar nanostructure in CVD ZnS composed of alternating layers of thickness on the order of 10 to 100 nm. The scattering model produces a family of solutions which depends on the difference in refractive index (Δn), the layer thickness, and the roughness. Reasonable ratios of roughness to layer thickness require Δn for CVD ZnS with higher values than can be explained solely by the Δn between sphalerite and wurtzite phases of ZnS. Other evidence suggests a substantial oxygen component in CVD ZnS that could result in the lower refractive index Zn(O,S) necessary for the model. Differences in transmission for CVD ZnS, elemental ZnS, and multispectral ZnS can be explained simply by a different magnitude of Δn between the layers. Absolute transmission is modeled satisfactorily from the band edge to 10 μm using this approach. Extracted Δn's from transmission measurements of various samples correlate well with measured hexagonality from x-ray diffraction.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John McCloy "Semi-empirical scattering model for chemical vapor deposited zinc sulfide", Proc. SPIE 7302, Window and Dome Technologies and Materials XI, 73020W (27 April 2009); https://doi.org/10.1117/12.819536
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KEYWORDS
Zinc

Scattering

Chemical vapor deposition

Refractive index

Rayleigh scattering

Statistical modeling

Mie scattering

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