Optical properties of rubrene thin film grown by thermal evaporation

Bing Yang; Jinxiang Deng; Wei-ping Zhao

doi:10.1117/12.834824

24 August 2009 Optical properties of rubrene thin film grown by thermal evaporation

Bing Yang, Jinxiang Deng, Wei-ping Zhao

Proceedings Volume 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors; 738112 (2009) https://doi.org/10.1117/12.834824
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

In the present study, high quality rubrene thin film is fabricated through control of growth time with thermally evaporation under vacuum. Optical microscopy is employed to analyze the surface morphology of the samples. A mode of thin film growth from an amorphous continuous film to polycrystalline rubrene thin film could be controlled by growth time. Images of such structures [acquired using optical microscopy] show that they are polycrystalline structure, which splays out from a central point. Rubrene thin film is linear structure when the growth time is greater than 7 hours. Meanwhile, the optical constant (absorption coefficient (α)) is analyzed by transmission and absorption spectrum. The optical band gap (Eg) is deduced by Tauc formula. From the ultraviolet absorption spectrum of rubrene thin film, we observe two shape peaks, which can be explained by Davydov splitting (factor-group splitting).

Citation Download Citation

Bing Yang, Jinxiang Deng, and Wei-ping Zhao "Optical properties of rubrene thin film grown by thermal evaporation", Proc. SPIE 7381, International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors, 738112 (24 August 2009); https://doi.org/10.1117/12.834824

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