Detecting molecular stress in metals

Eduardo Hernandez-Gomez; J. G. Suarez-Romero; Juan B. Hurtado-Ramos

doi:10.1117/12.827005

21 August 2009 Detecting molecular stress in metals

Eduardo Hernandez-Gomez, J. G. Suarez-Romero, Juan B. Hurtado-Ramos

Proceedings Volume 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III; 74050Z (2009) https://doi.org/10.1117/12.827005
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

In a recent work we reported dependence between the hardness of steels and its refraction complex index, showing that this optical property can be taken as a measure of the electronic interaction inside the molecular structure of metals. If the molecular structure changes then the electronic interaction changes and it is observed as a modification of its refraction index. In this work we present experimental results on steel pieces thermally treated and maintained in rest in the laboratory for material stabilization. The refraction complex index showed variations through a several days period. Variations are attributed to released stresses of the material. The steel sample is thermally treated with a tempering process and tested with an optical setup. The refractive index of the sample is measured through several days, showing variations. The ratio of changes is grater in the first days, showing an exponential decaying in subsequent periods of time.

Citation Download Citation

Eduardo Hernandez-Gomez, J. G. Suarez-Romero, and Juan B. Hurtado-Ramos "Detecting molecular stress in metals", Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050Z (21 August 2009); https://doi.org/10.1117/12.827005

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