Performance of supersmooth x-ray mandrels for new hard x-ray missions

D. Vernani; G. Borghi; O. Citterio; S. Moretti; A. Ritucci; G. Sironi; M. Riva; S. Basso; G. Pareschi; G. Tagliaferri; B. Negri

doi:10.1117/12.828192

31 August 2009 Performance of supersmooth x-ray mandrels for new hard x-ray missions

D. Vernani, G. Borghi, O. Citterio, S. Moretti, A. Ritucci, G. Sironi, M. Riva, S. Basso, G. Pareschi, G. Tagliaferri, B. Negri

Author Affiliations +

Proceedings Volume 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV; 74370X (2009) https://doi.org/10.1117/12.828192
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

Focusing mirrors manufactured via galvanic replication process from negative shape mandrels is the candidate solution for some of next future X-ray missions. Media Lario Technologies (MLT) is the industrial enabler developing, in collaboration with Brera Astronomical Observatory (INAF/OAB), the Optical Payload for future Hard X-ray mission. Concerning mandrel technology, MLT is engaged in a development programme aiming at improving the mandrels performance and their production rate. The angular resolution and the reflectivity of the mirrors replicated from the mandrels are strongly dependent on the mandrel performances and their stability. High throughput X-ray missions, require the massive production of mandrels in a short time, with angular resolution better than 7 arcsec Half Energy Width (HEW) and a surface micro-roughness in the order of 0.3 nm RMS. In order to achieve these results, several technological aspects are under investigation using a proprietary multistep surface finishing process. In particular, the metrology and the estimated optical performances of the mandrel are computed by means of dedicated post-processing and herein reported. Microroughness, medium scale errors, azimuthal slope error, axial slope errors, and mechanical dimensions are the quantities that have been measured by using atomic force microscope, high resolution optical profiler, contactless rotondimeter and high accuracy axial profilometer.

Citation Download Citation

D. Vernani, G. Borghi, O. Citterio, S. Moretti, A. Ritucci, G. Sironi, M. Riva, S. Basso, G. Pareschi, G. Tagliaferri, and B. Negri "Performance of supersmooth x-ray mandrels for new hard x-ray missions", Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370X (31 August 2009); https://doi.org/10.1117/12.828192

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
8 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Surface finishing

Mirrors

Hard x-rays

X-rays

Spatial resolution

Optics manufacturing

Metrology

Show All Keywords

Keywords/Phrases

Search In:

Publication Years