A novel method for measuring the 2D information of burst strong flashing object in space

P. Zhong; Ye Jin

doi:10.1117/12.838210

20 November 2009 A novel method for measuring the 2D information of burst strong flashing object in space

P. Zhong, Ye Jin

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 751122 (2009) https://doi.org/10.1117/12.838210
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

The burst strongly flashing event taking place in space such as strong explosion in low air is very random in time and position, and its duration time is very short. In this paper, a photoelectric measuring device, namely, 2D angle localizer for measuring 2D angle of a burst strongly flashing object appearing in place randomly has been presented. It mainly includes detecting head with narrow slot, cylinder silicon photoelectric receiver, absolute photoelectric encoder and computer. It can complete the measurement of 2D information, namely, the azimuth angle and pitching angle of the center position of a spatial flashing object. The principle of measuring angle and basic structure of measuring angle device are introduced. The critical parts of the device are briefly described. A contrast experiment of measuring the sun's 2D angle by 2D angle localizer and theodolite was made. The measuring results and accuracy analysis have been given. Due to being equipped with variable gain amplifiers and three silicon photoelectric accepters with cylinder surface, the 2D angle localizer has the characteristics of Wide dynamic measurement range and omnidirectional angle measurement. The measuring accuracy of 2D angle localizer is more than 2mil and the act of measuring can be finished in 0.5s.

Citation Download Citation

P. Zhong and Ye Jin "A novel method for measuring the 2D information of burst strong flashing object in space", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751122 (20 November 2009); https://doi.org/10.1117/12.838210

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