Paper
27 January 2010 Implementation and evaluation of a penalized alternating minimization algorithm for computational DIC microscopy
Author Affiliations +
Proceedings Volume 7533, Computational Imaging VIII; 75330E (2010) https://doi.org/10.1117/12.839020
Event: IS&T/SPIE Electronic Imaging, 2010, San Jose, California, United States
Abstract
We present the implementation and evaluation of a penalized alternating minimization (AM) method1 for the computation of a specimen's complex transmittance function (magnitude and phase) from images captured with Differential Interference Contrast (DIC) microscopy. The magnitude of the transmittance function is constrained to be less than 1. The penalty is on the roughness of the complex transmittance function. Without the penalty, we show via simulation that the difference between the true and estimated transmittance function takes values in the null space of the DIC point-spread function, thereby characterizing the ill-posed nature of this inverse problem. The penalty effectively attenuates larger spatial frequencies that are in this null space. The algorithm is implemented on yeast cell images after proper normalization of the measured data. Preliminary results are promising.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chrysanthe Preza and Joseph A. O'Sullivan "Implementation and evaluation of a penalized alternating minimization algorithm for computational DIC microscopy", Proc. SPIE 7533, Computational Imaging VIII, 75330E (27 January 2010); https://doi.org/10.1117/12.839020
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KEYWORDS
Digital image correlation

Signal to noise ratio

Yeast

Point spread functions

Microscopy

Error analysis

Transmittance

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