Surface-emitting THz sources based on difference-frequency generation in mid-infrared quantum cascade lasers

M. Geiser; C. Pflügl; A. Belyanin; Q. J. Wang; N. Yu; M. A. Belkin; T. Edamura; H. Kan; M. Fischer; A. Wittmann; J. Faist; Federico Capasso

doi:10.1117/12.845066

12 February 2010 Surface-emitting THz sources based on difference-frequency generation in mid-infrared quantum cascade lasers

M. Geiser, C. Pflügl, A. Belyanin, Q. J. Wang, N. Yu, M. A. Belkin, T. Edamura, H. Kan, M. Fischer, A. Wittmann, J. Faist, Federico Capasso

Author Affiliations +

Proceedings Volume 7616, Novel In-Plane Semiconductor Lasers IX; 76160R (2010) https://doi.org/10.1117/12.845066
Event: SPIE OPTO, 2010, San Francisco, California, United States

Abstract

We report a surface-emitting THz source based on intracavity difference-frequency generation in dual-wavelength midinfrared quantum cascade lasers with integrated giant second-order nonlinear susceptibility. The THz light is coupled out of the waveguide by a second-order grating etched into the laser ridges. In contrast to sources where the difference-frequency radiation is emitted from the facet, this approach enables extraction of the THz emission from the whole length of the device even when the coherence length is small. We also studied the properties of the mid-infrared pump beams and found that due to gain competition, mid-infrared modes tend to start lasing in higher order lateral modes. The mid-infrared mode with the lower threshold current reduces population inversion for the second laser with the higher threshold current due to stimulated emission. We developed a rate equation model to quantitatively describe mode interactions due to mutual gain depletion.

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M. Geiser, C. Pflügl, A. Belyanin, Q. J. Wang, N. Yu, M. A. Belkin, T. Edamura, H. Kan, M. Fischer, A. Wittmann, J. Faist, and Federico Capasso "Surface-emitting THz sources based on difference-frequency generation in mid-infrared quantum cascade lasers", Proc. SPIE 7616, Novel In-Plane Semiconductor Lasers IX, 76160R (12 February 2010); https://doi.org/10.1117/12.845066

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