Paper
18 May 2010 Experimental validation of bidirectional reflection and transmission distribution measurements of specular and scattering materials
Lars O. Grobe, Stephen Wittkopf, Peter Apian-Bennewitz, Jacob C. Jonsson, Mike Rubin
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Abstract
The development of advanced materials for facades aims to achieve higher energy efficiency of buildings. Successful application of these materials depends on the availability of reliable characterization data. While data derived from integrated measurements of transmission and reflection is widely available, it does not allow to characterize the angular dependence of the performance of such materials. The Bidirectional Reflection-Transmission Distribution (BRTD) can be measured by commercially available Gonio-Photometers and, complimenting integrated transmittance and reflectance, allows the assessment of facade materials and thus supports both their development and application. Validation of the obtained data is crucial to back these measurements. Integration of validation procedures into the operation of a characterization laboratory allowing a well-defined approach to quality control is presented for a range of typical material and sample types: * consistency checks of measurement data * cross-checking of integrated material properties derived from BRTD data with integrating sphere measurements * round-robin comparison between laboratories using comparable devices The results of of these first measurements are discussed. Potential to further improve the availability of reliable angular resolved characterization data for the building sector is identified.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lars O. Grobe, Stephen Wittkopf, Peter Apian-Bennewitz, Jacob C. Jonsson, and Mike Rubin "Experimental validation of bidirectional reflection and transmission distribution measurements of specular and scattering materials", Proc. SPIE 7725, Photonics for Solar Energy Systems III, 772510 (18 May 2010); https://doi.org/10.1117/12.854011
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Cited by 12 scholarly publications.
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KEYWORDS
Reflectivity

Lamps

Halogens

Mirrors

Scattering

Sensors

Silicon

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